Advanced Transmission Electron Microscopy
Vi har samlet 2 aktuelle varer med samme produktnavn hos Saxo DK på én side.
Denne side samler varer efter forhandler og produktnavn. Det betyder ikke nødvendigvis, at varerne er officielle varianter af samme produkt.
Muligheder hos forhandleren
Vi kan ikke med sikkerhed afgøre, om varerne er varianter eller separate produkter. Sammenlign detaljerne før du går videre.
| Produkt | Varenr. | Pris | Handling |
|---|---|---|---|
| Advanced Transmission Electron Microscopy | 9781493982493 | 699,95 kr | Til butik |
| Advanced Transmission Electron Microscopy | 9781493982493 | 699,95 kr | Til butik |
Produktdetaljer
Advanced Transmission Electron Microscopy
699,95 kr
Til butik- Varenr.:
- 9781493982493
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction . As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.
Læs mere hos Saxo DKAdvanced Transmission Electron Microscopy
699,95 kr
Til butik- Varenr.:
- 9781493982493
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction . As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.
Læs mere hos Saxo DKOplysningerne kommer fra Saxo DKs aktuelle produktdata.